We are looking for an experienced ASIC Test Engineer to develop and implement advanced testing strategies for complex semiconductor devices. This role involves working on cutting-edge technologies used in automotive and space applications, focusing on performance, reliability, and quality.
The tasks and responsibilities will be to develop and execute comprehensive test strategies for ASICs. Conduct reliability tests (eg High-Temperature Operating Life - HTOL) and interpret results using models such as the bathtub curve. Perform qualification and evaluation of components like DC-DC converters, PLLs, ADCs, and DACs. Analyze and optimize signal-to-noise ratio (SNR) in testing environments. Test critical parameters in Phase-Locked Loop (PLL) designs, with an emphasis on jitter analysis. Evaluate component robustness under various stress conditions. Support the development of photonics testing and collaborate with photonics teams. Work with probe cards and test sockets across both production and development phases. Conduct failure analysis and apply test on continue on fail methods when needed. Interpret Capability Index (CP) and Process Capability Index (CPK) metrics. Characterize ASICs and high-power components (1000W+). Stay informed on emerging technologies, including chiplet-based semiconductor design and testing.
Skills and experience needed for this role:
- At least 7 years of experience in ASIC testing or related roles
- Hands-on experience with Automated Test Equipment (ATE)
- Familiarity with automotive qualification standards (eg AEC-Q100)
- Expertise in HTOL and other reliability testing methodologies
- Strong understanding of semiconductor components and systems
- Experience in PLL testing with a focus on jitter analysis
- Working knowledge of probe card and test socket technologies
- Experience in failure analysis and root cause investigation
- Proficiency in analyzing CP and CPK values
- Experience with high-power component testing (ideally >1000W)
- Awareness of chiplet technologies and their impact on semiconductor testing